Electromigration in Thin Films and Electronic Devices: Materials and Reliability . Choong-Un Kim

Electromigration in Thin Films and Electronic Devices: Materials and Reliability



Download Electromigration in Thin Films and Electronic Devices: Materials and Reliability



Electromigration in Thin Films and Electronic Devices: Materials and Reliability Choong-Un Kim ebook pdf
Publisher: Woodhead Publishing
Language: English
Page: 345
ISBN: 1845699378, 9781845699376

Choong-Un Kim is Professor of Materials Science and Engineering at the University of Texas at Arlington, USA.



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